ENHANCED BIT ERROR RATE TESTER SUPPORTS CLOCK RATES FROM T1 TO OC-12
DALLAS, TX-May 2, 2002-Dallas Semiconductor introduces the DS2174, an enhanced, high-speed addition to Dallas Semiconductor's family of bit error rate testers that is pin compatible with Transwitch's XBERT. The DS2174 supports clock rates from T1 up to OC-12 speeds (622Mbps) and is software programmable to generate/detect bit patterns necessary for error-performance monitoring in digital transmission systems.
It includes an 8-bit parallel-control port to access control registers and a choice of bit-serial, nibble-parallel, or byte-parallel data interfaces. It is capable of generating and synchronizing to pseudorandom patterns up to 2(32) - 1 bits in length and user-defined repetitive patterns up to 512 bytes in length. Large 48-bit count and bit error count registers are used to detect bit error rates of up to 10(-2).
The DS2174 is available in a 44-pin PLCC package. Prices start at $19.50 (10,000-up, FOB USA). It is available in both industrial and commercial grades. Samples are available now.
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