Abstract: This application note describes how to alter the printed wiring board (PWB) netlist of a design containing the DS33R41 Inverse-Multiplexing Ethernet Mapper with Integrated Quad Port T1/E1/J1 Transceiver so that the netlist complies with the Joint Test Action Group (JTAG) specifications. These changes are necessary because the DS33R41 was designed as a multichip module with multiple die in a single package which can not be defined by the Boundary-Scan Description Language (BSDL) for board level JTAG testing. The application note contains external pin mapping tables, internal die pad bond tables, and connection information allowing the designer to quickly achieve accurate JTAG boundary-scan board testing.
Introduction
When manufacturing hardware for a telecommunications system, one of the basic tasks is to test the system for any production flaws. While there are many ways to test the hardware, one of the most popular methods uses the Joint Test Action Group (JTAG) boundary-scan method. The boundary-scan test method involves some minor changes to the hardware before production so that hardware verification can be performed after production. During design, all of the Integrated Circuit (IC) devices which support JTAG are connected in a serial daisy-chain fashion through the JTAG test access port. Verification is done by a specialized JTAG test system which connects to the test access port. The JTAG test system then uses a combination of the printed wiring board (PWB) netlist, Boundary-Scan Description Language (BSDL) files, and PWB connectivity test vectors to verify the pin-to-pin connections.
BSDL testing is straightforward. Nonetheless, multichip module devices like the DS33R41 Inverse-Multiplexing Ethernet Mapper with Integrated Quad Port T1/E1/J1 Transceiver cannot be properly described by a single BSDL file because there are multiple die in a single package. This shortcoming can be overcome with simple modification to the PWB netlist and by using two BSDL files to describe the device package instead of just one.
Modifying the Printed Wiring Board Netlist
Before JTAG boundary scan testing can be performed, the portion of the PWB netlist that describes the external connections to the DS33R41 package must be modified to split those connections between the internal DS33Z41 die and DS21458 die. Once completed, the netlist will define the DS33R41 package with two independent reference designators. These reference designators allow two different BSDL files to individually describe the DS33Z41 and DS21458 connections inside the DS33R41 package.
Tables 1, 2, and 3 and Figure 1 make the task of modifying the netlist easy. Table 1 lists all of the external DS33R41 package pins which only connect to the DS33Z41 die. Table 2 lists all of the external DS33R41 package pins which only connect to the DS21458 die. Table 3 lists all of the external DS33R41 package pins which connect to both the DS33Z41 die and the DS21458 die. Figure 1 shows the same information in a format created for easier viewing.
This PWB netlist modification and JTAG boundary scan test have been performed using a Concise Net List format netlist of the DS33R41 engineering evaluation board designed with Cadence® Concept. Designers can perform the operation in approximately 30 to 60 minutes, depending on the netlist type and individual's skill level. Most of the edits to the netlist file can be done with a simple text editor. Depending on the netlist type, however, it may be possible to edit the netlist in a program such as Microsoft® Excel which can sort rows based on column data. However the editing is done, it is important to pay careful attention to detail. Irregular data such as header and footer information must be maintained, and the netlist must always be saved in the original format.
The following is a list of steps needed to complete the process.
Open the netlist file in a text editor and group all of the nets connected to the DS33R41 reference designator. As an example, the DS33R41 package on the DS33R41 Engineering Evaluation board had a reference designator of U01.
Separate all of the nets isolated in step 1 among those connected to the DS33Z41 die, those connected to the DS21458 die, and those connected to both dies. Use Tables 1, 2, and 3 and Figure 1 to complete this task.
Change the reference designator for all of the DS33Z41 nets from U01 to U01_D1 (short for reference designator U01, device 1). This step assumes that the DS33R41 reference designator was U01. If the reference designator is not U01, change U01_D1 appropriately.
Change the reference designator for all of the DS21458 nets from U01 to U01_D2 (short for reference designator U01, device 2). This assumes that the DS33R41 reference designator was U01. If it is not U01, change U01_D2 appropriately.
Duplicate the 22 shared nets so that there is exactly two of each. Split them into two groups.
Change the reference designator for first group of nets created in step 5 from U01 to U01_D1. This assumes that the DS33R41 reference designator was U01. If it is not U01, change U01_D1 appropriately.
Change the reference designator for second group of nets created in step 5 from U01 to U01_D2. This assumes that the DS33R41 reference designator was U01. If it is not U01, change U01_D1 appropriately.
Save the newly created netlist.
The newly created PCB netlist will actually contain two instances for the DS33R41 physical device. The first instance will describe the pin connections related to the DS33Z41 section; the second will describe pin connections related to the DS21458 section. The new netlist can be loaded into any JTAG test suite along with the two DS33R41 BSDL files and any associated test vectors.
Although the method documented here has been tested and verified to work properly, there can be some unforeseen complications with other netlist formats. If additional assistance is needed during JTAG boundary scan testing, please use the contact information below.
Table 1. Device Pins for DS33Z41 Die Only
Pin
Description
Pin
Description
Pin
Description
A1
VSS
J18
RXD[2]
P13
VSS
B16
VDD3.3
J19
RXD[0]
P14
SDMASK[1]
B17
VDD3.3
J20
VSS
P15
SRAS
B19
VDD3.3
K3
VSS
P16
SDA[11]
B20
VDD3.3
K5
VSS
P17
VDD1.8
C19
VDD3.3
K6
VSS
P18
SDMASK[2]
C20
REF_CLK
K7
VSS
P19
SDATA[18]
D10
VDD3.3
K8
VSS
P20
SDATA[19]
D15
VSS
K13
RMIIMIIS
R11
VSS
D18
VDD3.3
K14
TCLKE
R12
SDATA[12]
D19
VDD3.3
K15
TSERO
R13
SDATA[6]
D20
VDD3.3
K16
TBSYNC
R14
SCAS
E19
VDD3.3
K17
JTDI1
R15
SDCS
E20
MDC
K18
RX_DV
R16
SBA[0]
F11
VSS
K19
RX_CLK
R17
SDA[10]
F14
VSS
K20
RX_ERR
R18
SDATA[31]
F18
VDD3.3
L4
VSS
R19
VSS
F19
VDD3.3
L5
VSS
R20
VDD1.8
F20
MDIO
L6
VSS
T11
SDATA[13]
G4
VSS
L7
VSS
T12
SDATA[14]
G5
VSS
L8
VSS
T13
SDATA[5]
G7
VSS
L14
RCLKI
T14
VDD1.8
G12
VSS
L15
RBSYNC
T15
SWE
G13
JTMS1
L16
RSERI
T16
SDA[8]
G14
JTRST1
L17
DCEDTES
T17
SDA[0]
G15
MODEC[1]
L18
TX_CLK
T18
SDATA[16]
G16
VDD3.3
L19
TX_EN
T19
SDATA[27]
G18
QOVF
L20
TXD[0]
T20
SDATA[26]
G19
REF_CLKO
M5
VSS
U11
SDATA[15]
G20
VSS
M6
VSS
U12
SDATA[4]
H5
VSS
M7
VSS
U13
VSS
H6
VSS
M12
VSS
U14
SDCLKO
H7
VSS
M13
VDD1.8
U15
VSS
H8
VSS
M14
SDATA[3]
U16
SDA[1]
H9
VSS
M15
SDATA[1]
U17
SDA[4]
H10
VSS
M16
VSS
U18
SDATA[29]
H14
JTDO1
M17
VDD1.8
U19
SDATA[25]
H15
RST
M18
TXD[2]
U20
SDATA[24]
H16
CS
M19
TXD[1]
V11
SDATA[11]
H18
RXD[1]
M20
TXD[3]
V12
SDATA[10]
H19
RXD[3]
N12
VSS
V13
SDATA[8]
H20
VSS
N14
VDD1.8
V14
VSS
J6
VSS
N15
VDD1.8
V15
SDA[9]
J7
VSS
N16
VDD1.8
V16
SDA[7]
J8
VSS
N17
VDD1.8
V17
SDMASK[3]
J9
VSS
N18
VSS
V18
SDATA[30]
J15
VSS
N19
RX_CRS/CRS_DV
V19
SDATA[22]
J16
VDD1.8
N20
COL_DET
V20
VDD1.8
J17
JTCLK1
P12
VSS
W11
SDATA[0]
W12
SDATA[9]
W19
SDATA[20]
T16
SDA[6]
W13
SDATA[7]
W20
SDATA[23]
Y17
SDA[2]
W14
VDD1.8
Y11
SDATA[2]
Y18
VDD1.8
W15
SBA[1]
Y12
VSS
Y19
SDATA[28]
W16
SDA[5]
Y13
SDMASK[0]
Y20
SDATA[21]
W17
SDA[3]
Y14
SYSCLKI
W18
SDATA[17]
Y15
VDD1.8
Table 2. Device Pins for DS21458 Die Only
Pin
Description
Pin
Description
Pin
Description
A2
TSSYNC3
D3
TCHBLK3
G9
RNEGO2
A3
RMSYNC3
D4
RLOS/LOTC3
G10
DVSS
A4
RCHBLK3
D5
RSIG3
G11
DVSS
A5
RPOSO3
D6
TPD
G17
D0
A6
TSYSCLK3
D7
RNEGO3
H1
RCLK3
A9
TCLK2
D8
DVDD
H2
TSIG3
A10
TVDD
D9
DVDD
H3
DVSS
A11
TRING2
D11
DVDD
H4
TSYSCLK1
A12
TTIP2
D12
RCLKO2
H11
RSIG2
A13
TVSS
D13
TSYNC2
H12
RVSS
A14
TCHBLK2
D14
RCHCLK2
H13
RVSS
A15
RSYNC2
E1
TTIP3
J1
DVSS
B1
DVSS
E2
TTIP3
J2
TSERI3
B2
DVSS
E3
TCHCLK3
J3
TCLKT3
B3
RSYNC3
E5
RVSS
J4
DVDD
B4
RCHCLK3
E6
RTIP3
J5
TSYSCLK2
B5
RSERO3
E8
DVDD
J10
RPOSO2
B6
DVDD
E9
DVDD
J11
RVSS
B8
TSIG2
E10
DVDD
J12
RRING2
B9
TSERI2
E11
TCLKO2
J13
RTIP2
B10
TVDD
E12
TPOSO2
J14
RVDD
B11
TRING2
E13
TSSYNC2
K1
RSYSCLK1
B12
TTIP2
E14
RFSYNC2
K2
MCLK1
B13
TVSS
F1
TRING3
K4
RSERO1
B14
RCHBLK2
F2
TRING3
K9
RSERO2
C1
RCLKO3
F3
TNEGO3
K10
RSYSCLK2
C2
TSYNC3
F4
TPOSO3
L1
RVSS
C3
DVSS
F5
RVSS
L2
TRTRST
C4
RFSYNC3
F6
RRING3
L3
BPCLK1
C6
RSYSCLK3
F7
RVDD
L9
TCHCLK4
C7
JTDI2
F8
DVDD
L10
JTDO2
C8
RCLK2
F9
DVDD
L11
JTMS2
C9
DVDD
F10
DVDD
L12
MCLK2
C10
DVDD
F12
DVSS
L13
JTRST2
C11
DVDD
F13
RMSYNC2
M1
RRING1
C12
TNEGO2
G1
TVDD
M2
RVSS
C13
TCHCLK2
G2
DVDD
M3
RSIG1
C14
RLOS/LOTC2
G3
TCLKO3
M4
TCHBLK1
D1
TVSS
G6
RVSS
M8
RCHBLK4
D2
TVSS
G8
BPCLK2
M9
RSYNC4
M10
RFSYNC4
R5
DVSS
V6
RNEGO4
M11
TCLKO4
R6
DVSS
V7
RCHCLK4
N1
RTIP1
R7
TSERI4
V8
RLOS/LOTC4
N2
RVSS
R8
RVDD
V9
RMSYNC4
N3
RPOSO1
R9
RRING4
V10
DVSS
N4
RNEGO1
R10
RVSS
W1
TRING1
N5
DVSS
T1
TTIP1
W2
TVDD
N6
DVSS
T2
TVSS
W3
TSYNC1
N7
RCLK4
T3
DVSS
W4
TSSYNC1
N8
DVSS
T4
DVSS
W5
RCLK1
N9
TCLKT4
T5
DVSS
W6
CST
N10
TNEGO4
T6
DVSS
W7
TVSS
N11
TPOSO4
T7
RSERO4
W8
TTIP4
N13
TSSYNC4
T8
RVSS
W9
TRING4
P1
RVDD
T9
RTOP4
W10
TVDD
P2
RCHCLK1
T10
RVSS
Y1
RMSYNC1
P3
RCHBLK1
U1
TTIP1
Y2
RSYNC1
P4
TNEGO1
U2
TVSS
Y3
TCHCLK1
P5
DVSS
U4
TCLKT1
Y4
TSERI1
P6
TSYNC4
U5
DVSS
Y5
TSYSCLK4
P7
TSIG4
U6
DVSS
Y6
RSYSCLK4
P8
DVSS
U7
RPOSO4
Y7
TVSS
P9
JTCLK2
U8
RSIG4
Y8
TTIP4
P10
RCLKO4
U9
DVSS
Y9
TRING4
P11
TCHBLK4
U10
DVSS
Y10
TVDD
R1
RFSYNC1
V1
TRING1
R2
RLOS/LOTC1
V2
TVDD
R3
TPOSO1
V4
RCLKO1
R4
TCLKO1
V5
TSIG1
Table 3. Shared Device Pins for DS33Z41 and DS21458 Die
Pin
Description
Pin
Description
Pin
Description
A16
WR/RW
C16
A9
E17
A6
A17
D1
C17
A7
E18
A4
A18
A5
C18
A2
F15
RD/DS
A19
A0
D16
D5
F16
D3
A20
A1
D17
A8
F17
D2
B15
D6
E7
MODEC[0]
G17
D0
B18
A3
E15
INT
C15
D7
E16
D4
More Detailed Image (PDF, kB) Figure 1. DS33R41 400-ball BGA, color-coded pinout and die map.
References
If you have additional questions on the JTAG testing of the DS33R41, please contact the Telecommunication Applications support team by email, , or telephone at 01-972-371-6555.
For more information about the DS33R41 Inverse-Multiplexing Ethernet Mapper with Integrated Quad Port T1/E1/J1 Transceiver, please consult the appropriate data sheet at: T/E Carrier and Packetized Communications.
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